Spectroscopic Ellipsometry Characterization of As-Deposited and Annealed Non-Stoichiometric Indium Zinc Tin Oxide Thin Film
出版年份 2021 全文链接
标题
Spectroscopic Ellipsometry Characterization of As-Deposited and Annealed Non-Stoichiometric Indium Zinc Tin Oxide Thin Film
作者
关键词
-
出版物
Materials
Volume 14, Issue 3, Pages 578
出版商
MDPI AG
发表日期
2021-01-27
DOI
10.3390/ma14030578
参考文献
相关参考文献
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