Spectroscopic Ellipsometry Characterization of As-Deposited and Annealed Non-Stoichiometric Indium Zinc Tin Oxide Thin Film
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Title
Spectroscopic Ellipsometry Characterization of As-Deposited and Annealed Non-Stoichiometric Indium Zinc Tin Oxide Thin Film
Authors
Keywords
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Journal
Materials
Volume 14, Issue 3, Pages 578
Publisher
MDPI AG
Online
2021-01-27
DOI
10.3390/ma14030578
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