标题
Optical characteristics of Bi12SiO20 single crystals by spectroscopic ellipsometry
作者
关键词
Sillenites, Ellipsometry, Optical properties, Critical points
出版物
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING
Volume 120, Issue -, Pages 105286
出版商
Elsevier BV
发表日期
2020-07-28
DOI
10.1016/j.mssp.2020.105286
参考文献
相关参考文献
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