Improved stability of dielectric/metal/dielectric-structured transparent conductive films with the insertion of Ni layer under thermal oxidation environment
Improved stability of dielectric/metal/dielectric-structured transparent conductive films with the insertion of Ni layer under thermal oxidation environment
作者
关键词
Thin films, Sputtering, Photoelectric stability, Optical materials and properties
Discover Peeref hubs
Discuss science. Find collaborators. Network.
Join a conversationAsk a Question. Answer a Question.
Quickly pose questions to the entire community. Debate answers and get clarity on the most important issues facing researchers.
Get Started