Improved stability of dielectric/metal/dielectric-structured transparent conductive films with the insertion of Ni layer under thermal oxidation environment

标题
Improved stability of dielectric/metal/dielectric-structured transparent conductive films with the insertion of Ni layer under thermal oxidation environment
作者
关键词
Thin films, Sputtering, Photoelectric stability, Optical materials and properties
出版物
MATERIALS LETTERS
Volume 282, Issue -, Pages 128844
出版商
Elsevier BV
发表日期
2020-10-15
DOI
10.1016/j.matlet.2020.128844

向作者/读者发起求助以获取更多资源

Reprint

联系作者

Discover Peeref hubs

Discuss science. Find collaborators. Network.

Join a conversation

Ask a Question. Answer a Question.

Quickly pose questions to the entire community. Debate answers and get clarity on the most important issues facing researchers.

Get Started