期刊
MICROELECTRONICS RELIABILITY
卷 114, 期 -, 页码 -出版社
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.microrel.2020.113755
关键词
Power devices; Ionizing radiation; Terrestrial cosmic radiation; Charge spectrometry
A dedicated experimental setup is presented for the acquisition of single ionization events generated in power devices by ionizing radiation. This spectrometer chain is designed to be used for long-term experiments, where devices are submitted to the natural terrestrial cosmic radiation (TCR), for TCR characterizations, as well as in conjunction with radioactive sources. Every single ionization event that generates in the device charge pulses ranging from 1 fC up to 2 pC is recorded together with its time stamp and waveform. Original noise filtering and pile-up rejection strategies are implemented. The dedicated hardware and software are described in very detail in conjunction with the main operating procedures.
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