4.3 Article

Experimental setup to monitor non-destructive single events triggered by ionizing radiation in power devices

期刊

MICROELECTRONICS RELIABILITY
卷 114, 期 -, 页码 -

出版社

PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.microrel.2020.113755

关键词

Power devices; Ionizing radiation; Terrestrial cosmic radiation; Charge spectrometry

向作者/读者索取更多资源

A dedicated experimental setup is presented for the acquisition of single ionization events generated in power devices by ionizing radiation. This spectrometer chain is designed to be used for long-term experiments, where devices are submitted to the natural terrestrial cosmic radiation (TCR), for TCR characterizations, as well as in conjunction with radioactive sources. Every single ionization event that generates in the device charge pulses ranging from 1 fC up to 2 pC is recorded together with its time stamp and waveform. Original noise filtering and pile-up rejection strategies are implemented. The dedicated hardware and software are described in very detail in conjunction with the main operating procedures.

作者

我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。

评论

主要评分

4.3
评分不足

次要评分

新颖性
-
重要性
-
科学严谨性
-
评价这篇论文

推荐

暂无数据
暂无数据