Active Learning of Convolutional Neural Network for Cost-Effective Wafer Map Pattern Classification

出版年份 2020 全文链接

标题

作者

关键词

出版物

Volume 33, Issue 2, Pages 258-266

出版商

Institute of Electrical and Electronics Engineers (IEEE)

发表日期

2020-02-20

DOI

10.1109/tsm.2020.2974867

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