High‐Resolution Crystal Truncation Rod Scattering: Application to Ultrathin Layers and Buried Interfaces
出版年份 2020 全文链接
标题
High‐Resolution Crystal Truncation Rod Scattering: Application to Ultrathin Layers and Buried Interfaces
作者
关键词
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出版物
Advanced Materials Interfaces
Volume -, Issue -, Pages 1901772
出版商
Wiley
发表日期
2020-02-20
DOI
10.1002/admi.201901772
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