In situ surface/interface x-ray diffractometer for oxide molecular beam epitaxy

标题
In situ surface/interface x-ray diffractometer for oxide molecular beam epitaxy
作者
关键词
-
出版物
REVIEW OF SCIENTIFIC INSTRUMENTS
Volume 87, Issue 1, Pages 013901
出版商
AIP Publishing
发表日期
2016-01-06
DOI
10.1063/1.4939100

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