The Impact of Ferroelectric FETs on Digital and Analog Circuits and Architectures

标题
The Impact of Ferroelectric FETs on Digital and Analog Circuits and Architectures
作者
关键词
-
出版物
IEEE Design & Test
Volume 37, Issue 1, Pages 79-99
出版商
Institute of Electrical and Electronics Engineers (IEEE)
发表日期
2019-10-04
DOI
10.1109/mdat.2019.2944094

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