IEEE Design & Test

期刊名

IEEE Design & Test

IEEE DES TEST

ISSN / eISSN

2168-2356

目标和范围

IEEE Design & Test offers original works describing the models, methods, and tools used to design and test microelectronic systems from devices and circuits to complete systems-on-chip and embedded software. The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies. The magazine seeks to bring to its readers not only important technology advances but also technology leaders, their perspectives through its columns, interviews, and roundtable discussions. Topics include semiconductor IC design, semiconductor intellectual property blocks, design, verification and test technology, design for manufacturing and yield, embedded software and systems, low-power and energy-efficient design, electronic design automation tools, practical technology, and standards.

研究方向

计算机：硬件

工程：电子与电气

CiteScore

3.60 查看趋势图

CiteScore 学科排名

类别	分区	排名
Engineering - Electrical and Electronic Engineering	Q2	#340/738
Engineering - Hardware and Architecture	Q3	#92/169
Engineering - Software	Q3	#223/404

Web of Science 核心合集

Science Citation Index Expanded (SCIE)	Social Sciences Citation Index (SSCI)
Indexed	-

类别 (Journal Citation Reports 2023)	分区
COMPUTER SCIENCE, HARDWARE & ARCHITECTURE - SCIE	Q3
ENGINEERING, ELECTRICAL & ELECTRONIC - SCIE	Q3

H-index

72

出版国家或地区

UNITED STATES

出版商

IEEE Computer Society

年文章数

61

Open Access

NO

通讯方式

445 HOES LANE, PISCATAWAY, USA, NJ, 08855-4141