Genome-Wide Mapping of Quantitative Trait Loci Conferring All-Stage and High-Temperature Adult-Plant Resistance to Stripe Rust in Spring Wheat Landrace PI 181410
出版年份 2020 全文链接
标题
Genome-Wide Mapping of Quantitative Trait Loci Conferring All-Stage and High-Temperature Adult-Plant Resistance to Stripe Rust in Spring Wheat Landrace PI 181410
作者
关键词
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出版物
INTERNATIONAL JOURNAL OF MOLECULAR SCIENCES
Volume 21, Issue 2, Pages 478
出版商
MDPI AG
发表日期
2020-01-13
DOI
10.3390/ijms21020478
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