期刊
THIN SOLID FILMS
卷 690, 期 -, 页码 -出版社
ELSEVIER SCIENCE SA
DOI: 10.1016/j.tsf.2019.137554
关键词
Nickel oxide; Thin films; Sol-gel spin coating; Electrical properties; Optical properties
In this work, Nickel oxide (NiO) films were coated over Si (100) substrates at different precursor molarities (0.1-0.9 M) using sol-gel spin coating technique. The structural, morphological, electrical and optical properties of the films were investigated. X-ray diffraction and field-emission scanning electron microscopy (FESEM) results indicated that the crystalline quality of NiO films was improved with increasing the precursor molarity. All NiO films are composed of well-defined nanograins as confirmed by FESEM analysis. The average size of these nanograins was increased from similar to 20 to similar to 36 nm as the precursor molarity was increased from 0.1 to 0.9 M. The electrical measurements indicated that all NiO films exhibited p-type conductivity. The carrier concentration was decreased from 14.30 x 10(16) to 0.0098 x 10(16) cm(-3) with the increase of molarity from 0.1 M to 0.9 M, whereas the resistivity and mobility were increased from 36.92 to 7840 Omega.cm and from 1.26 to 9.96 cm(2) v(-1) s(-1), respectively. The energy band gap of the films was decreased from 3.85 to 3.31 eV upon increasing the molarity from 0.1 to 0.9 M. Based on our findings, NiO film prepared at 0.9 M displayed the best properties and hence it is a good candidate in various applications.
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