Local crystallographic phase detection and texture mapping in ferroelectric Zr doped HfO2 films by transmission-EBSD
出版年份 2019 全文链接
标题
Local crystallographic phase detection and texture mapping in ferroelectric Zr doped HfO2 films by transmission-EBSD
作者
关键词
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出版物
APPLIED PHYSICS LETTERS
Volume 115, Issue 22, Pages 222902
出版商
AIP Publishing
发表日期
2019-11-27
DOI
10.1063/1.5129318
参考文献
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- (2018) C. Mart et al. APPLIED PHYSICS LETTERS
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- (2018) Takao Shimizu et al. APPLIED PHYSICS LETTERS
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- (2017) Lun Xu et al. JOURNAL OF APPLIED PHYSICS
- Understanding the formation of the metastable ferroelectric phase in hafnia–zirconia solid solution thin films
- (2017) Min Hyuk Park et al. Nanoscale
- Growth of epitaxial orthorhombic YO1.5-substituted HfO2 thin film
- (2015) Takao Shimizu et al. APPLIED PHYSICS LETTERS
- Ferroelectricity in undoped hafnium oxide
- (2015) Patrick Polakowski et al. APPLIED PHYSICS LETTERS
- On the structural origins of ferroelectricity in HfO2 thin films
- (2015) Xiahan Sang et al. APPLIED PHYSICS LETTERS
- The origin of ferroelectricity in Hf1−xZrxO2: A computational investigation and a surface energy model
- (2015) R. Materlik et al. JOURNAL OF APPLIED PHYSICS
- Ferroelectric Hafnium Oxide Based Materials and Devices: Assessment of Current Status and Future Prospects
- (2015) J. Muller et al. ECS Journal of Solid State Science and Technology
- From MFM Capacitors Toward Ferroelectric Transistors: Endurance and Disturb Characteristics of ${\rm HfO}_{2}$-Based FeFET Devices
- (2013) Stefan Mueller et al. IEEE TRANSACTIONS ON ELECTRON DEVICES
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- (2012) Ekaterina Yurchuk et al. THIN SOLID FILMS
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- (2012) Patrick W. Trimby ULTRAMICROSCOPY
- Ferroelectricity in hafnium oxide thin films
- (2011) T. S. Böscke et al. APPLIED PHYSICS LETTERS
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- (2011) R.R. KELLER et al. JOURNAL OF MICROSCOPY
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