Fast High-Fidelity Readout of a Single Trapped-Ion Qubit via Machine-Learning Methods

标题
Fast High-Fidelity Readout of a Single Trapped-Ion Qubit via Machine-Learning Methods
作者
关键词
-
出版物
Physical Review Applied
Volume 12, Issue 1, Pages -
出版商
American Physical Society (APS)
发表日期
2019-07-23
DOI
10.1103/physrevapplied.12.014038

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