Structural and Electrical Characterization of 2” Ammonothermal Free-Standing GaN Wafers. Progress toward Pilot Production
出版年份 2019 全文链接
标题
Structural and Electrical Characterization of 2” Ammonothermal Free-Standing GaN Wafers. Progress toward Pilot Production
作者
关键词
-
出版物
Materials
Volume 12, Issue 12, Pages 1925
出版商
MDPI AG
发表日期
2019-06-14
DOI
10.3390/ma12121925
参考文献
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注意:仅列出部分参考文献,下载原文获取全部文献信息。- Correlation between nanopipes formed from screw dislocations during homoepitaxial growth by metal-organic vapor-phase epitaxy and reverse leakage current in vertical p–n diodes on a free-standing GaN substrates
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