Comparison of low frequency charge noise in identically patterned Si/SiO2 and Si/SiGe quantum dots

标题
Comparison of low frequency charge noise in identically patterned Si/SiO2 and Si/SiGe quantum dots
作者
关键词
-
出版物
APPLIED PHYSICS LETTERS
Volume 108, Issue 25, Pages 253108
出版商
AIP Publishing
发表日期
2016-06-24
DOI
10.1063/1.4954700

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