Composition determination of β-(AlxGa1−x)2O3layers coherently grown on (010) β-Ga2O3substrates by high-resolution X-ray diffraction

标题
Composition determination of β-(AlxGa1−x)2O3layers coherently grown on (010) β-Ga2O3substrates by high-resolution X-ray diffraction
作者
关键词
-
出版物
Applied Physics Express
Volume 9, Issue 6, Pages 061102
出版商
Japan Society of Applied Physics
发表日期
2016-05-24
DOI
10.7567/apex.9.061102

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