Edge Intelligence—On the Challenging Road to a Trillion Smart Connected IoT Devices

出版年份 2019 全文链接

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作者

关键词

出版物

IEEE Design & Test

Volume 36, Issue 2, Pages 41-64

出版商

Institute of Electrical and Electronics Engineers (IEEE)

发表日期

2019-02-14

DOI

10.1109/mdat.2019.2899075

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