Structural and Electrical Characterization of SiO2 Gate Dielectrics Deposited from Solutions at Moderate Temperatures in Air

出版年份 2016 全文链接

标题

作者

关键词

出版物

Volume 9, Issue 1, Pages 529-536

出版商

American Chemical Society (ACS)

发表日期

2016-12-09

DOI

10.1021/acsami.6b11214

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