Evaluation of Pulsed I–V Analysis as Validation Tool of Nonlinear RF Models of GaN-Based HFETs

标题
Evaluation of Pulsed I–V Analysis as Validation Tool of Nonlinear RF Models of GaN-Based HFETs
作者
关键词
-
出版物
IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 65, Issue 12, Pages 5307-5313
出版商
Institute of Electrical and Electronics Engineers (IEEE)
发表日期
2018-10-18
DOI
10.1109/ted.2018.2872513

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