HERMES: a soft X-ray beamline dedicated to X-ray microscopy

Ultrahigh-spatial-resolution chemical and magnetic imaging by laser-based photoemission electron microscopy

(2015) Toshiyuki Taniuchi et al.   REVIEW OF SCIENTIFIC INSTRUMENTS

X-ray properties and interface study of B4C/Mo and B4C/Mo2C periodic multilayers

(2013) F. Choueikani et al.   APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING

Preventing carbon contamination of optical devices for X-rays: the effect of oxygen on photon-induced dissociation of CO on platinum

(2012) Paul Risterucci et al.   JOURNAL OF SYNCHROTRON RADIATION

A new aberration-corrected, energy-filtered LEEM/PEEM instrument II. Operation and results

(2012) R.M. Tromp et al.   ULTRAMICROSCOPY

First experimental proof for aberration correction in XPEEM: Resolution, transmission enhancement, and limitation by space charge effects

(2012) Th. Schmidt et al.   ULTRAMICROSCOPY

Carbon contamination of soft X-ray beamlines: dramatic anti-reflection coating effects observed in the 1 keV photon energy region

(2011) C. Chauvet et al.   JOURNAL OF SYNCHROTRON RADIATION

High-resolution soft X-ray beamline ADRESS at the Swiss Light Source for resonant inelastic X-ray scattering and angle-resolved photoelectron spectroscopies

(2010) V. N. Strocov et al.   JOURNAL OF SYNCHROTRON RADIATION

Recent advances in chemical and magnetic imaging of surfaces and interfaces by XPEEM

(2008) A Locatelli et al.   JOURNAL OF PHYSICS-CONDENSED MATTER