High-resolution soft X-ray beamline ADRESS at the Swiss Light Source for resonant inelastic X-ray scattering and angle-resolved photoelectron spectroscopies

标题
High-resolution soft X-ray beamline ADRESS at the Swiss Light Source for resonant inelastic X-ray scattering and angle-resolved photoelectron spectroscopies
作者
关键词
-
出版物
JOURNAL OF SYNCHROTRON RADIATION
Volume 17, Issue 5, Pages 631-643
出版商
International Union of Crystallography (IUCr)
发表日期
2010-07-09
DOI
10.1107/s0909049510019862

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