High Spatial Resolution Time-of-Flight Secondary Ion Mass Spectrometry for the Masses: A Novel Orthogonal ToF FIB-SIMS Instrument withIn SituAFM

Imaging surface analysis: Lateral resolution and its relation to contrast and noise

(2010) Mathias Senoner et al.   JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY

From FIB-SIMS to SIMS-FIB. The prospects for a 10 nm lateral resolution SIMS instrument with full FIB functionality

(2010) David S. McPhail et al.   SURFACE AND INTERFACE ANALYSIS

Strategies for improving the sensitivity of FIB-SIMS

(2010) Libing Li et al.   SURFACE AND INTERFACE ANALYSIS

13-µm optically-pumped semiconductor disk laser by wafer fusion

(2009) Jari Lyytikäinen et al.   OPTICS EXPRESS

Three-dimensional molecular imaging using mass spectrometry and atomic force microscopy

(2008) Andreas Wucher et al.   APPLIED SURFACE SCIENCE

Focused ion beam implantation of Ga in Si and Ge: fluence-dependent retention and surface morphology

(2008) Hubert Gnaser et al.   SURFACE AND INTERFACE ANALYSIS