Recent Progress of Ferroelectric-Gate Field-Effect Transistors and Applications to Nonvolatile Logic and FeNAND Flash Memory

标题
Recent Progress of Ferroelectric-Gate Field-Effect Transistors and Applications to Nonvolatile Logic and FeNAND Flash Memory
作者
关键词
-
出版物
Materials
Volume 3, Issue 11, Pages 4950-4964
出版商
MDPI AG
发表日期
2010-11-19
DOI
10.3390/ma3114950

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