Effect of an ultrathin SiO2 interfacial layer on the hysteretic current–voltage characteristics of CeOx-based metal–insulator–metal structures

出版年份 2012 全文链接

标题

作者

关键词

出版物

Volume 533, Issue -, Pages 38-42

出版商

Elsevier BV

发表日期

2012-11-10

DOI

10.1016/j.tsf.2012.10.105

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