期刊
THIN SOLID FILMS
卷 542, 期 -, 页码 150-154出版社
ELSEVIER SCIENCE SA
DOI: 10.1016/j.tsf.2013.07.004
关键词
Bismuth ferrite; Thin films; Chemical solution deposition; Excess Bi; Ferroelectric
类别
资金
- Grants-in-Aid for Scientific Research [23686094] Funding Source: KAKEN
Polycrystalline BiFeO3 thin films with overdosed Bi of up to 15 mol% were prepared through chemical solution deposition. All the films crystallized in R3c structure after annealing at 550 degrees C for 5 h by normal furnace. The analysis of out-of-plane and in-plane X-ray diffraction showed that the lattice constants and in-plane stress of films strongly depended on the amount of excess Bi, where lattice constants were minimums and in-plane stress was a maximum at excess Bi of 5 mol%. The films exhibited the largest saturation polarization of 14.8 mu C cm(-2) at excess Bi of 5 mol%, revealing a correlation with the in-plane tensile stress. These results suggested that the excess Bi greatly influenced the polarization properties of BiFeO3 thin films through the lattice distortion induced by the in-plane stress. (C) 2013 Elsevier B.V. All rights reserved.
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