期刊
THIN SOLID FILMS
卷 520, 期 14, 页码 4586-4589出版社
ELSEVIER SCIENCE SA
DOI: 10.1016/j.tsf.2011.10.188
关键词
Ferroelectric thin film; Ferroelectric tunnel junction; Pulsed laser deposition; Piezoresponse force microscopy; Reflection electron energy loss spectroscopy; Structural characterization
Ferroelectric ultrathin BaTiO3 (BTO) films in contact with Fe underlayer have been grown by pulsed laser deposition onto MgO(100) substrates in a single vacuum cycle. The structural properties of the composite system are investigated by Rutherford backscattering spectrometry/channeling and cross-sectional transmission electron microscopy. The BTO band gap is measured by in situ reflection electron energy loss spectroscopy to be E-g = 4.1-4.3 eV depending on the growth conditions. The ferroelectric nature of BTO (thickness down to 3 nm) on top of Fe is demonstrated by piezoresponse force microscopy, which shows an out-of-plane piezoelectric coefficient of 17 +/- 4 pm/V. The obtained results are promising in the view of integrating BTO/Fe stacks in functional ferroelectric tunnel junctions. (C) 2011 Elsevier B.V. All rights reserved.
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