期刊
THIN SOLID FILMS
卷 519, 期 10, 页码 3283-3287出版社
ELSEVIER SCIENCE SA
DOI: 10.1016/j.tsf.2010.12.122
关键词
Vanadium oxide; Thermochromic materials; Thin films; Multi-layer optical model; Reflectance spectra; Spectroscopic ellipsometry
类别
资金
- Ministere de la Region Wallonne
- European Community
- Fonds National de la Recherche Scientifique (FNRS) of Belgium
- Mirage project [5579]
Thermochromic films of VO2 were deposited by DC reactive magnetron sputtering on stainless steel substrate. Complex refractive indexes of VO2 were determined by ellipsometric spectroscopy (0.35-16.5 mu m) for different film thicknesses. Optical simulations were performed to model the spectral reflectance of the film/substrate system for a film thickness of 100 nm and 200 nm and to monitor the optical contrast of the thermochromic layers by comparing the spectral reflectance at 25 degrees C and 100 degrees C. The good agreement observed between experimental and theoretical spectra demonstrates the adequacy of the model for predicting the optical properties of the samples. (C) 2010 Elsevier B.V. All rights reserved.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据