Genetic control of grain yield and grain physical characteristics in a bread wheat population grown under a range of environmental conditions

标题
Genetic control of grain yield and grain physical characteristics in a bread wheat population grown under a range of environmental conditions
作者
关键词
Quantitative Trait Locus, Simple Sequence Repeat Marker, Quantitative Trait Locus Analysis, DArT Marker, Test Weight
出版物
THEORETICAL AND APPLIED GENETICS
Volume 127, Issue 7, Pages 1607-1624
出版商
Springer Nature
发表日期
2014-05-27
DOI
10.1007/s00122-014-2322-y

向作者/读者发起求助以获取更多资源

Reprint

联系作者

Create your own webinar

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started