Angle-resolved XPS depth profiling of modeled structures: testing and improvement of the method

标题
Angle-resolved XPS depth profiling of modeled structures: testing and improvement of the method
作者
关键词
-
出版物
SURFACE AND INTERFACE ANALYSIS
Volume 42, Issue 6-7, Pages 649-652
出版商
Wiley
发表日期
2010-04-23
DOI
10.1002/sia.3361

向作者/读者发起求助以获取更多资源

Find the ideal target journal for your manuscript

Explore over 38,000 international journals covering a vast array of academic fields.

Search

Create your own webinar

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now