Origins of Highly Stable Al-evaporated Solution-processed ZnO Thin Film Transistors: Insights from Low Frequency and Random Telegraph Signal Noise
出版年份 2015 全文链接
标题
Origins of Highly Stable Al-evaporated Solution-processed ZnO Thin Film Transistors: Insights from Low Frequency and Random Telegraph Signal Noise
作者
关键词
-
出版物
Scientific Reports
Volume 5, Issue 1, Pages -
出版商
Springer Nature
发表日期
2015-11-03
DOI
10.1038/srep16123
参考文献
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注意:仅列出部分参考文献,下载原文获取全部文献信息。- Aqueous zinc ammine complex for solution-processed ZnO semiconductors in thin film transistors
- (2014) Si Yun Park et al. RSC Advances
- Revealing Al evaporation-assisted functions in solution-processed ZnO thin film transistors
- (2014) Tae Sung Kang et al. Journal of Materials Chemistry C
- High-Performance ZnO Transistors Processed Via an Aqueous Carbon-Free Metal Oxide Precursor Route at Temperatures Between 80-180 °C
- (2013) Yen-Hung Lin et al. ADVANCED MATERIALS
- Electrical and Structural Analyses of Solution-Processed Li-Doped ZnO Thin Film Transistors Exposed to Ambient Conditions
- (2013) Tae Sung Kang et al. Applied Physics Express
- Surface and core contribution to 1/f-noise in InAs nanowire metal-oxide-semiconductor field-effect transistors
- (2013) K.-M. Persson et al. APPLIED PHYSICS LETTERS
- The influence of oxygen partial pressure on the performance and stability of Ge-doped InGaO thin film transistors
- (2013) Kwang-Ho Lee et al. CERAMICS INTERNATIONAL
- Low-frequency noise in multilayer MoS2field-effect transistors: the effect of high-k passivation
- (2013) Junhong Na et al. Nanoscale
- Highly stable solution-processed ZnO thin film transistors prepared via a simple Al evaporation process
- (2013) Tae Sung Kang et al. Journal of Materials Chemistry C
- Oxide Semiconductor Thin-Film Transistors: A Review of Recent Advances
- (2012) E. Fortunato et al. ADVANCED MATERIALS
- Low temperature and solution-processed Na-doped zinc oxide transparent thin film transistors with reliable electrical performance using methanol developing and surface engineering
- (2012) Kyongjun Kim et al. JOURNAL OF MATERIALS CHEMISTRY
- Electrical-Stress-Induced Threshold Voltage Instability in Solution-Processed ZnO Thin-Film Transistors: An Experimental and Simulation Study
- (2011) Dipti Gupta et al. IEEE TRANSACTIONS ON ELECTRON DEVICES
- Low-frequency noise in amorphous indium-gallium-zinc oxide thin-film transistors from subthreshold to saturation
- (2010) Jae Chul Park et al. APPLIED PHYSICS LETTERS
- High-performance low-temperature solution-processable ZnO thin film transistors by microwave-assisted annealing
- (2010) Taehwan Jun et al. JOURNAL OF MATERIALS CHEMISTRY
- Bias Stress Stability of Solution-Processed Zinc Tin Oxide Thin-Film Transistors
- (2009) Youngmin Jeong et al. JOURNAL OF THE ELECTROCHEMICAL SOCIETY
- Aqueous Inorganic Inks for Low-Temperature Fabrication of ZnO TFTs
- (2008) Stephen T. Meyers et al. JOURNAL OF THE AMERICAN CHEMICAL SOCIETY
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