Acquisition parameters optimization of a transmission electron forward scatter diffraction system in a cold-field emission scanning electron microscope for nanomaterials characterization

Nanometres-resolution Kikuchi patterns from materials science specimens with transmission electron forward scatter diffraction in the scanning electron microscope

(2013) N. BRODUSCH et al.   JOURNAL OF MICROSCOPY

Orientation mapping of nanostructured materials using transmission Kikuchi diffraction in the scanning electron microscope

(2012) Patrick W. Trimby   ULTRAMICROSCOPY

A critical review of orientation microscopy in SEM and TEM

(2011) S. Zaefferer   CRYSTAL RESEARCH AND TECHNOLOGY

Transmission EBSD from 10 nm domains in a scanning electron microscope

(2011) R.R. KELLER et al.   JOURNAL OF MICROSCOPY

Three-dimensional electron microscopy simulation with the CASINO Monte Carlo software

(2011) Hendrix Demers et al.   SCANNING

Towards ultrahigh resolution EBSD by low accelerating voltage

(2010) D. R. Steinmetz et al.   MATERIALS SCIENCE AND TECHNOLOGY

Development of a New Quantitative X-Ray Microanalysis Method for Electron Microscopy

(2010) Paula Horny et al.   MICROSCOPY AND MICROANALYSIS

Atom-by-atom structural and chemical analysis by annular dark-field electron microscopy

(2010) Ondrej L. Krivanek et al.   NATURE

Energy-filtered electron backscatter diffraction

(2007) Andrew Deal et al.   ULTRAMICROSCOPY