Direct Insight into Grain Boundary Reconstruction in PolycrystallineCu(In,Ga)Se2with Atomic Resolution
出版年份 2012 全文链接
标题
Direct Insight into Grain Boundary Reconstruction in PolycrystallineCu(In,Ga)Se2with Atomic Resolution
作者
关键词
-
出版物
PHYSICAL REVIEW LETTERS
Volume 108, Issue 7, Pages -
出版商
American Physical Society (APS)
发表日期
2012-02-15
DOI
10.1103/physrevlett.108.075502
参考文献
相关参考文献
注意:仅列出部分参考文献,下载原文获取全部文献信息。- Sample preparation for atomic-resolution STEM at low voltages by FIB
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