4.4 Article Proceedings Paper

Electronic, electrical and optical properties of undoped and Na-doped NiO thin films

期刊

THIN SOLID FILMS
卷 591, 期 -, 页码 255-260

出版社

ELSEVIER SCIENCE SA
DOI: 10.1016/j.tsf.2015.04.043

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X-ray photoelectron spectroscopy; Reflection electron energy spectroscopy; Extended X-ray absorption fine structure; Electrical properties; Optical properties; Sodium-doped nickel oxide

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The electrical and optical properties as well as the electronic structure of sodium-doped (Na-doped) nickel oxide (NiO) thin films were investigated using X-ray photoelectron spectroscopy (XPS), reflection electron energy loss spectroscopy (REELS), X-ray absorption near edge structure, and extended X-ray absorption fine structure. The XPS results confirmed the presence of Ni-O bonds of the NiO phase for all films via the Ni 2p spectra. The NiO thin films annealed above 200 degrees C have both nickel oxide and nickel metal phase. The REELS spectra showed that the band gaps of NiO thin films after Na doping were decreased. Na-doped NiO thin films exhibited relatively low resistivity compared to undoped NiO thin films. In addition, the Na-doped NiO thin films deposited at room temperature have p-type conductivity with a low electrical resistivity of 11.57 Omega cm and high optical transmittance of 80% in the visible light region. Our results demonstrate that Na doping plays a crucial role in enhancing the electrical and optical properties of NiO thin films. (C) 2015 Elsevier B.V. All rights reserved.

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