标题
Full optical characterization of coherent x-ray nanobeams by ptychographic imaging
作者
关键词
-
出版物
OPTICS EXPRESS
Volume 19, Issue 17, Pages 16324
出版商
The Optical Society
发表日期
2011-08-11
DOI
10.1364/oe.19.016324
参考文献
相关参考文献
注意:仅列出部分参考文献,下载原文获取全部文献信息。- Ptychographic coherent x-ray diffractive imaging in the water window
- (2011) K. Giewekemeyer et al. OPTICS EXPRESS
- Hard x-ray nanobeam characterization by coherent diffraction microscopy
- (2010) A. Schropp et al. APPLIED PHYSICS LETTERS
- Hard and soft X-ray microscopy and tomography in catalysis: bridging the different time and length scales
- (2010) Jan-Dierk Grunwaldt et al. CHEMICAL SOCIETY REVIEWS
- Non-destructive and quantitative imaging of a nano-structured microchip by ptychographic hard X-ray scanning microscopy
- (2010) A. SCHROPP et al. JOURNAL OF MICROSCOPY
- Ptychographic X-ray computed tomography at the nanoscale
- (2010) Martin Dierolf et al. NATURE
- Reconstruction of an astigmatic hard X-ray beam and alignment of K-B mirrors from ptychographic coherent diffraction data
- (2010) Cameron M. Kewish et al. OPTICS EXPRESS
- Ptychographic characterization of the wavefield in the focus of reflective hard X-ray optics
- (2010) Cameron M. Kewish et al. ULTRAMICROSCOPY
- Breaking the 10 nm barrier in hard-X-ray focusing
- (2009) Hidekazu Mimura et al. Nature Physics
- Measurement of coherent x-ray focused beams by phase retrieval with transverse translation diversity
- (2009) Manuel Guizar-Sicairos et al. OPTICS EXPRESS
- Probe retrieval in ptychographic coherent diffractive imaging
- (2009) Pierre Thibault et al. ULTRAMICROSCOPY
- An improved ptychographical phase retrieval algorithm for diffractive imaging
- (2009) Andrew M. Maiden et al. ULTRAMICROSCOPY
- Focusing of hard x-rays to 16 nanometers with a multilayer Laue lens
- (2008) Hyon Chol Kang et al. APPLIED PHYSICS LETTERS
- Nano-imaging of trace metals by synchrotron X-ray fluorescence into dopaminergic single cells and neurite-like processes
- (2008) Asuncion Carmona et al. JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY
- Probing the structure of heterogeneous diluted materials by diffraction tomography
- (2008) Pierre Bleuet et al. NATURE MATERIALS
- Coherent X-Ray Diffraction Imaging with Nanofocused Illumination
- (2008) C. G. Schroer et al. PHYSICAL REVIEW LETTERS
- High-Resolution Scanning X-ray Diffraction Microscopy
- (2008) P. Thibault et al. SCIENCE
Publish scientific posters with Peeref
Peeref publishes scientific posters from all research disciplines. Our Diamond Open Access policy means free access to content and no publication fees for authors.
Learn MoreCreate your own webinar
Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.
Create Now