Full optical characterization of coherent x-ray nanobeams by ptychographic imaging

标题
Full optical characterization of coherent x-ray nanobeams by ptychographic imaging
作者
关键词
-
出版物
OPTICS EXPRESS
Volume 19, Issue 17, Pages 16324
出版商
The Optical Society
发表日期
2011-08-11
DOI
10.1364/oe.19.016324

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