Point Defect Clusters and Dislocations in FIB Irradiated Nanocrystalline Aluminum Films: An Electron Tomography and Aberration-Corrected High-Resolution ADF-STEM Study

标题
Point Defect Clusters and Dislocations in FIB Irradiated Nanocrystalline Aluminum Films: An Electron Tomography and Aberration-Corrected High-Resolution ADF-STEM Study
作者
关键词
-
出版物
MICROSCOPY AND MICROANALYSIS
Volume 17, Issue 06, Pages 983-990
出版商
Cambridge University Press (CUP)
发表日期
2011-10-27
DOI
10.1017/s143192761101213x

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