Understanding the micro structure of Berea Sandstone by the simultaneous use of micro-computed tomography (micro-CT) and focused ion beam-scanning electron microscopy (FIB-SEM)

标题
Understanding the micro structure of Berea Sandstone by the simultaneous use of micro-computed tomography (micro-CT) and focused ion beam-scanning electron microscopy (FIB-SEM)
作者
关键词
-
出版物
MICRON
Volume 42, Issue 5, Pages 412-418
出版商
Elsevier BV
发表日期
2010-12-17
DOI
10.1016/j.micron.2010.12.002

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