Applications of focused ion beam for preparation of specimens of ancient ceramic for electron microscopy and synchrotron X-ray studies

出版年份 2009 全文链接

标题

作者

关键词

出版物

Volume 40, Issue 5-6, Pages 597-604

出版商

Elsevier BV

发表日期

2009-03-10

DOI

10.1016/j.micron.2009.02.012

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