High spatial resolution surface imaging and analysis of fungal cells using SEM and AFM

标题
High spatial resolution surface imaging and analysis of fungal cells using SEM and AFM
作者
关键词
-
出版物
MICRON
Volume 39, Issue 4, Pages 349-361
出版商
Elsevier BV
发表日期
2007-11-21
DOI
10.1016/j.micron.2007.10.023

向作者/读者发起求助以获取更多资源

Find Funding. Review Successful Grants.

Explore over 25,000 new funding opportunities and over 6,000,000 successful grants.

Explore

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started