A technique to mitigate impact of process, voltage and temperature variations on design metrics of SRAM Cell

标题
A technique to mitigate impact of process, voltage and temperature variations on design metrics of SRAM Cell
作者
关键词
-
出版物
MICROELECTRONICS RELIABILITY
Volume 52, Issue 2, Pages 405-411
出版商
Elsevier BV
发表日期
2011-10-29
DOI
10.1016/j.microrel.2011.09.034

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