High-cycle fatigue life prediction for Pb-free BGA under random vibration loading

标题
High-cycle fatigue life prediction for Pb-free BGA under random vibration loading
作者
关键词
-
出版物
MICROELECTRONICS RELIABILITY
Volume 51, Issue 3, Pages 649-656
出版商
Elsevier BV
发表日期
2010-11-11
DOI
10.1016/j.microrel.2010.10.003

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