Controlling of electrical and interface state density properties of ZnO:Co/p-silicon diode structures by compositional fraction of cobalt dopant

出版年份 2011 全文链接

标题

作者

关键词

出版物

Volume 51, Issue 12, Pages 2195-2199

出版商

Elsevier BV

发表日期

2011-06-26

DOI

10.1016/j.microrel.2011.05.013

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