High-κ related reliability issues in advanced non-volatile memories

标题
High-κ related reliability issues in advanced non-volatile memories
作者
关键词
-
出版物
MICROELECTRONICS RELIABILITY
Volume 50, Issue 9-11, Pages 1251-1258
出版商
Elsevier BV
发表日期
2010-08-31
DOI
10.1016/j.microrel.2010.07.099

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