GaN HEMT reliability

标题
GaN HEMT reliability
作者
关键词
-
出版物
MICROELECTRONICS RELIABILITY
Volume 49, Issue 9-11, Pages 1200-1206
出版商
Elsevier BV
发表日期
2009-08-01
DOI
10.1016/j.microrel.2009.07.003

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