Hot electron transport studies of the Cu/Si(001) interface using ballistic electron emission microscopy

标题
Hot electron transport studies of the Cu/Si(001) interface using ballistic electron emission microscopy
作者
关键词
-
出版物
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
Volume 27, Issue 4, Pages 2044
出版商
American Vacuum Society
发表日期
2009-07-31
DOI
10.1116/1.3136761

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