期刊
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A
卷 30, 期 4, 页码 -出版社
A V S AMER INST PHYSICS
DOI: 10.1116/1.4721329
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Atomic force microscopy and second-harmonic generation data show that boron doping enhances the rate of oxidation of H-terminated silicon. Holes cause a greater increase in the reactivity of the Si-H up bonds than that of the Si-Si back bonds. (C) 2012 American Vacuum Society. [http://dx.doi.org/10.1116/1.4721329]
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