In-Situ Probe of Gate Dielectric-Semiconductor Interfacial Order in Organic Transistors: Origin and Control of Large Performance Sensitivities

出版年份 2012 全文链接

标题

作者

关键词

出版物

Volume 134, Issue 28, Pages 11726-11733

出版商

American Chemical Society (ACS)

发表日期

2012-06-19

DOI

10.1021/ja3036493

Do you already have a recorded webinar? Grow your audience and get more views by easily listing your recording on Peeref.

Upload Now

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now