期刊
JOURNAL OF THE AMERICAN CERAMIC SOCIETY
卷 92, 期 4, 页码 870-875出版社
WILEY-BLACKWELL
DOI: 10.1111/j.1551-2916.2008.02901.x
关键词
-
The grain-boundary chemistry of fine-grained spinel MgO center dot nAl(2)O(3) (mean grain size below micron) has been investigated by STEM microanalysis. We have quantified the concentration of each element across the grain boundaries. Stoichiometry variations are observed from the grain-boundary region to the bulk. The Al/Mg ratio increases from 2.1 in the bulk to 2.35 at the grain-boundary regions. X-ray quantification allows us to reveal and to characterize the space-charge layer in the subgrain boundary. The grain-boundary cores are negatively charged due to V-Mg '' vacancies in excess, and in the subgrain-boundary region, an opposite, positive space-charge layer is obtained. The point defect composition and the characteristic (sign, space-charge potential Phi(infinity)) of the space-charge layer are discussed.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据