标题
Probing Charges on the Atomic Scale by Means of Atomic Force Microscopy
作者
关键词
-
出版物
PHYSICAL REVIEW LETTERS
Volume 115, Issue 7, Pages -
出版商
American Physical Society (APS)
发表日期
2015-08-14
DOI
10.1103/physrevlett.115.076101
参考文献
相关参考文献
注意:仅列出部分参考文献,下载原文获取全部文献信息。- Insights into Kelvin probe force microscopy data of insulator-supported molecules
- (2015) Julia L. Neff et al. PHYSICAL REVIEW B
- Using Metallic Noncontact Atomic Force Microscope Tips for Imaging Insulators and Polar Molecules: Tip Characterization and Imaging Mechanisms
- (2014) David Zhe Gao et al. ACS Nano
- Contrast Formation in Kelvin Probe Force Microscopy of Single π-Conjugated Molecules
- (2014) Bruno Schuler et al. NANO LETTERS
- Investigating atomic contrast in atomic force microscopy and Kelvin probe force microscopy on ionic systems using functionalized tips
- (2014) Leo Gross et al. PHYSICAL REVIEW B
- Formation and Characterization of a Molecule–Metal–Molecule Bridge in Real Space
- (2013) Florian Albrecht et al. JOURNAL OF THE AMERICAN CHEMICAL SOCIETY
- Direct Imaging of Covalent Bond Structure in Single-Molecule Chemical Reactions
- (2013) D. G. de Oteyza et al. SCIENCE
- Suppression of electron–vibron coupling in graphene nanoribbons contacted via a single atom
- (2013) Joost van der Lit et al. Nature Communications
- Imaging the charge distribution within a single molecule
- (2012) Fabian Mohn et al. Nature Nanotechnology
- A simple model of molecular imaging with noncontact atomic force microscopy
- (2012) Nikolaj Moll et al. NEW JOURNAL OF PHYSICS
- Multiscale approach for simulations of Kelvin probe force microscopy with atomic resolution
- (2012) Ali Sadeghi et al. PHYSICAL REVIEW B
- Atomic Force Microscopy Reveals Bistable Configurations of Dibenzo[a,h]thianthrene and their Interconversion Pathway
- (2012) Niko Pavliček et al. PHYSICAL REVIEW LETTERS
- Revealing the Angular Symmetry of Chemical Bonds by Atomic Force Microscopy
- (2012) J. Welker et al. SCIENCE
- Phantom Force Induced by Tunneling Current: A Characterization on Si(111)
- (2011) A. J. Weymouth et al. PHYSICAL REVIEW LETTERS
- Quantitative Atomic Force Microscopy with Carbon Monoxide Terminated Tips
- (2011) Zhixiang Sun et al. PHYSICAL REVIEW LETTERS
- Controlling the Charge State of a Single Redox Molecular Switch
- (2011) Thomas Leoni et al. PHYSICAL REVIEW LETTERS
- Organic structure determination using atomic-resolution scanning probe microscopy
- (2010) Leo Gross et al. Nature Chemistry
- Determination of the local contact potential difference of PTCDA on NaCl: a comparison of techniques
- (2009) S A Burke et al. NANOTECHNOLOGY
- New Insights on Atomic-Resolution Frequency-Modulation Kelvin-Probe Force-Microscopy Imaging of Semiconductors
- (2009) Sascha Sadewasser et al. PHYSICAL REVIEW LETTERS
- The Chemical Structure of a Molecule Resolved by Atomic Force Microscopy
- (2009) L. Gross et al. SCIENCE
- Measuring the Charge State of an Adatom with Noncontact Atomic Force Microscopy
- (2009) L. Gross et al. SCIENCE
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