Advances in TEM orientation microscopy by combination of dark-field conical scanning and improved image matching

标题
Advances in TEM orientation microscopy by combination of dark-field conical scanning and improved image matching
作者
关键词
-
出版物
ULTRAMICROSCOPY
Volume 109, Issue 11, Pages 1317-1325
出版商
Elsevier BV
发表日期
2009-06-17
DOI
10.1016/j.ultramic.2009.06.002

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